II-VI Materials for Detectors & sources - IR   UV   Gamma Ray   X-Ray
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2014 Workshop Calendar

Abstract Due Date June 20
Notification of Accepts/Rejects July 11
Deadline for Late-News Abstracts July 11
Deadline for Extended Abstracts August 22
Hotel Reservation Deadline September 29
Workshop Registration Deadline October 3
2014 II-VI Workshop October 21-23

The 2014 II-VI Workshop

Sheraton Inner Harbor Hotel
October 21 - October 23, 2014, Baltimore, Maryland
Link to hotel


Best Student Paper Award

The Best Student Paper award for 2013 workshop was presented to Mr. Clement Lobre, a Ph.D. candidate at the CEA-Léti, Minatec, France, for his presentation of the "Microstructure Characterization of p-Type Doping in HgCdTe." His thesis advisor is Professor Philippe Ballet.

Read about Spicer-Casselman award...


Selected Focus Topics

  • Emerging Infrared Detector Technologies
  • Multi-Band Detectors
  • Near-Room-Temperature IR Devices
  • HgCdTe Avalanche Photodiodes
  • Material Growth and Modeling
  • Substrates for HgCdTe:CdZnTe and Alternatives
  • Structural Characterization
  • Doping Issues in HgCdTe
  • Radiation Detectors
  • Solar Cells
  • Integration of 6.1-Å II-VI and III-V Materials
  • IR Applications of Plasmonics and Metamaterials

The scope of the Workshop includes the basic physics and chemistry of all II-VI materials and their applications...Read More...


Links to register for the Workshop and Hotel will be available soon. Please check the "Announcements" tab for more information.

2014 Workshop Co-Chairs

Dr. Enrico Bellotti
Boston University

Dr. Scott Johnson
Raytheon Vision Systems

Workshop Venue

October 21 - October 23, 2014
Sheraton Inner Harbor Hotel, Baltimore, MD

Workshop Coordinator

Palisades Convention Management
The 2014 II-VI Workshop
Attn: Alicia Waldron
411 Lafayette Street, Suite 201
New York, NY 10003
Phone: 212-460-8090 x216
fax: 212-460-5460
e-mail: awaldron@pcm411.com

Manuscript Coordinator

Yesim Anter
Project Coordinator
EPIR Technologies, Inc.
email: yanter@epir.com

Proceedings Published in:

TMS, Journal of Electronics Materials